DocumentCode :
1346216
Title :
A Repairable Multistate Device with General Repair Time
Author :
Yamashiro, Mitsuo
Author_Institution :
Department of Planning Technology; Ashikaga Institute of Technology; 268-1, Oomae-chÿ; Ashikaga-shi, Tochigi-ken JAPAN.
Issue :
3
fYear :
1980
Firstpage :
276
Lastpage :
276
Abstract :
This paper deals with a repairable multistate device with general repair time distribution. The Laplace transforms of state probability for such a device are obtained and a particular case is discussed.
Keywords :
Hazards; Laplace equations; Paramagnetic resonance; Stochastic processes; Technology planning; Text analysis; Multistate device; Supplementary variable method;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1980.5220823
Filename :
5220823
Link To Document :
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