Title :
A Cut Set Method for Reliability Evaluation of Systems Having s-Dependent Components
Author_Institution :
Department of Electrical Engineering; Texas A&M University; College Station, Texas 77843 USA.
Abstract :
The cut set method presently assumes components to be s-independent. This paper presents a method called MCS approach for extending the cut set approach to systems involving s-dependencies. The method is based on MCS theorem and consists in decomposing the system by cut sets and using the Markov processes for calculating terms in the cut set equations. The Markov process associated with only the members of one cut set need be considered at a time and the transition rate matrix of the entire system need not be generated. The MCS approach is feasible when Pr{C¿i} and F(S) can be calculated from the transition rate matrix of the members of Ci. This is possible when the MCS theorem applies and the MP of the entire system can be merged to obtain the MP of Ci. However, in many situations where the MCS theorem does not rigorously apply, approximate results may still be possible by the MCS method. The judgment in such cases is based on how approximately does the MCS theorem apply.
Keywords :
Equations; Failure analysis; Frequency measurement; Markov processes; Probability; Reliability theory; State-space methods; Upper bound; Cut Set; Failure frequency; Failure probability; Markov process; Mean cycle time; Mean down time; s-Dependent components;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220886