DocumentCode :
1346845
Title :
Current Switching in MgO-Based Magnetic Tunneling Junctions
Author :
Zhu, Wenzhong ; Li, Hai ; Chen, Yiran ; Wang, Xiaobin
Author_Institution :
Seagate Technol., Bloomington, MN, USA
Volume :
47
Issue :
1
fYear :
2011
Firstpage :
156
Lastpage :
160
Abstract :
Spin-transfer induced magnetization switching in a MgO-based magnetic tunneling junction (MTJ) has been measured over a wide time range. It was found that the switching current response is asymmetric going from the high resistance state to the low resistance state and vice versa. This asymmetry must be taken into consideration to optimize the read-write margin for a 1T1R (single transistor, single MTJ) memory device design, especially since the driving current that the transistor can supply is also asymmetric. The MTJ and the transistor characteristics need to be adjusted so that the spin-transfer switching current asymmetry matches the transistor driving current asymmetry at the desired operating speed. A new device configuration is proposed to achieve this optimization.
Keywords :
MRAM devices; boron alloys; cobalt alloys; iron alloys; magnesium compounds; magnetic multilayers; magnetic switching; magnetisation; magnetoelectronics; manganese alloys; platinum alloys; ruthenium; spin polarised transport; tunnelling magnetoresistance; PtMn-CoFe-Ru-CoFeB-MgO-CoFeB; current switching; magnetic tunneling junctions; memory device design; random access memories; read-write margin; resistance state; single transistor; spin-transfer induced magnetization switching; Current density; Electrical resistance measurement; Magnetic tunneling; Switches; Temperature measurement; Transistors; Magnetic switches; random access memories;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2085441
Filename :
5598530
Link To Document :
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