Title :
A 1.2-V 10-
W NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2
Author :
Sebastiano, Fabio ; Breems, Lucien J. ; Makinwa, Kofi A A ; Drago, Salvatore ; Leenaerts, Domine M W ; Nauta, Bram
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
Abstract :
An NPN-based temperature sensor with digital output has been realized in a 65-nm CMOS process. It achieves a batch-calibrated inaccuracy of (3σ ) and a trimmed inaccuracy of (3σ) over the temperature range from to 125 . This performance is obtained by the use of NPN transistors as sensing elements, the use of dynamic techniques, i.e., correlated double sampling and dynamic element matching, and a single room-temperature trim. The sensor draws 8.3 from a 1.2-V supply and occupies an area of 0.1 mm2
Keywords :
CMOS integrated circuits; correlation methods; signal sampling; temperature sensors; CMOS; correlated double sampling; dynamic element matching; npn transistor; power 10 muW; size 65 nm; temperature -70 C to 125 C; temperature sensor; voltage 1.2 V; CMOS analog integrated circuits; CMOS process; Intelligent sensors; Sigma delta modulation; Temperature sensors; CMOS analog integrated circuits; sigma-delta modulation; smart sensors; temperature sensors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2076610