• DocumentCode
    1346948
  • Title

    Gallium alloy interconnects for flip-chip assembly applications

  • Author

    Baldwin, Daniel F. ; Deshmukh, Rajan D. ; Hau, Christine S.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    23
  • Issue
    2
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    360
  • Lastpage
    366
  • Abstract
    For miniature interconnection applications, innovative material systems based on gallium alloys offer potentially attractive alternatives over commonly used bonding materials, such as solders and conductive adhesives, without the reliability and environmental drawbacks. Gallium alloys are mechanically alloyed mixtures of a liquid metal and metallic powders, formed at room temperature. The alloys cure to form solid intermetallic compounds. In this work, gallium alloys have been investigated for flip-chip interconnect applications. Specifically, this paper presents the results of a preliminary feasibility study demonstrating gallium alloys as advanced interconnect materials for flip-chip on laminate applications. The topics covered include the test vehicle assembly process, reliability screening results, preliminary failure mode analysis, and interconnect microstructure analysis. To demonstrate preliminary feasibility and application, gallium alloyed with copper and nickel was used as micro-miniature interconnects between bare silicon chips and printed circuit boards. This study shows preliminary feasibility of such interconnects and reliability tests demonstrate reasonable cyclic fatigue with the use of underfill. Moreover, through the course of this work a new micro-deposition technology for gallium alloys was developed which leverages existing industry infrastructure. This initial study represents a significant advancement in microelectronic interconnect materials unveiling the potential for an innovative lead-fine, low-temperature interconnect alternative
  • Keywords
    circuit reliability; failure analysis; flip-chip devices; gallium alloys; integrated circuit bonding; integrated circuit interconnections; microassembling; printed circuit manufacture; surface mount technology; DCA; Ga alloy interconnects; PCB attachment; SMT; Si; advanced interconnect materials; bare Si chips; cyclic fatigue; direct chip attach; failure mode analysis; feasibility study; flip-chip assembly applications; flip-chip on laminate applications; interconnect microstructure analysis; liquid metal; mechanically alloyed mixtures; metallic powders; miniature interconnection applications; printed circuit boards; reliability screening; solid intermetallic compounds; test vehicle assembly process; Assembly; Bonding; Circuit testing; Conducting materials; Conductive adhesives; Failure analysis; Gallium alloys; Integrated circuit interconnections; Materials reliability; Powders;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.846775
  • Filename
    846775