DocumentCode :
1346957
Title :
Contacts materials performances under break arc in automotive applications
Author :
Morin, Laurent ; Jemaa, Nouredine Ben ; Jeannot, Didier ; Pinard, Jacques ; Nedelec, Luc
Author_Institution :
Rennes I Univ., France
Volume :
23
Issue :
2
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
367
Lastpage :
375
Abstract :
New materials for electrical contacts have been developed recently, based on AgFeOx, AgFeRe, AgZnO, and doped AgSnO2. The work described here aims at evaluating the material transfer characteristics, and the contact resistance behavior, of these materials under break arc in automotive applications (14 V DC, 30-40 A). A comparison is made between these new materials and four reference materials: Ag, AgCdO, AgSnO2, and AgNi. Four of the new materials appear very promising: AgZnO, AgFeOx, doped AgSnO2 io 6, and EMB8. These combine the good transfer performance of AgCdO in inductive load, i.e., in long cathodic arc, with that of AgSnO2 in resistive load, i.e., in short anodic arc. For all materials, contact resistance is much higher in inductive load (7 mΩ) than in resistive load (1 mΩ). An explanation of the different behaviors of these materials is attempted by means of metallographic analysis
Keywords :
automotive electronics; circuit-breaking arcs; contact resistance; electrical contacts; silver compounds; 14 V; 30 to 40 A; AgFeO; AgFeOx; AgFeRe; AgZnO; automotive applications; break arc; contact resistance behavior; contacts materials performances; doped AgSnO2 EMB8; doped AgSnO2 io 6; inductive load; long cathodic arc; material transfer characteristics; metallographic analysis; resistive load; short anodic arc; Automobiles; Automotive applications; Automotive materials; Circuit testing; Contact resistance; Contactors; Inorganic materials; Materials testing; Relays; Welding;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.846776
Filename :
846776
Link To Document :
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