Title :
Novel multipeak current-voltage characteristics of series-connected negative differential resistance devices
Author :
Gan, Kwang-Jow ; Su, Yan-Kuin
Author_Institution :
Dept. of Electron. Eng., Kung-Shan Inst. of Technol., Tainan, Taiwan
fDate :
4/1/1998 12:00:00 AM
Abstract :
Three-peak current-voltage (I-V) characteristics can be obtained from the combination of two series-connected negative differential resistance (NDR) devices under certain conditions. We discuss these constraint conditions and demonstrate their role in the design of multipeak I-V characteristics based on NDR devices in series. These phenomena will provide some useful concepts in the multipeak circuit design. Especially, these novel multipeak I-V characteristics can be applied to the multiple-valued logic applications with less devices compared to the traditional structure that stacks N identical devices to obtain N peaks in the I-V curve.
Keywords :
multivalued logic circuits; negative resistance devices; I-V characteristics; MVL applications; multipeak current-voltage characteristics; multiple-valued logic applications; negative differential resistance devices; series-connected NDR devices; Application specific integrated circuits; Circuit synthesis; Complexity theory; Current-voltage characteristics; Forward contracts; Gallium nitride; High speed integrated circuits; Logic devices; Piecewise linear techniques; Voltage;
Journal_Title :
Electron Device Letters, IEEE
