Title :
Hard And Soft Failures In Dynamic RAM Fault Tolerant Memories
Author :
Smith, Arthur L.
Author_Institution :
Evaluation Department; Honeywell Process Control Division; Fort Washington, PA 19034 USA.
fDate :
4/1/1981 12:00:00 AM
Abstract :
A system reliability model is developed which includes a dynamic random-access memory (RAM). The model is useful for computing the reliability of a system with a fault-tolerant memory which uses techniques such as hardware redundancy, and error detection and (single error) correction algorithms. Hard and soft failure rates have been estimated to be constants. System behavior is treated as a Markov process.
Keywords :
DRAM chips; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Random access memory; Read-write memory; Redundancy; Reliability; Error correction; Fault-tolerant memories; Hard failures; Markov processes; Soft failures; System reliability modeling;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1981.5220963
