DocumentCode :
1347050
Title :
Digital circuit applications of resonant tunneling devices
Author :
Mazumder, Pinaki ; Kulkarni, Shriram ; Bhattacharya, Mayukh ; Sun, Jian Ping ; Haddad, George I.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
86
Issue :
4
fYear :
1998
fDate :
4/1/1998 12:00:00 AM
Firstpage :
664
Lastpage :
686
Abstract :
Many semiconductor quantum devices utilize a novel tunneling transport mechanism that allows picosecond device switching speeds. The negative differential resistance characteristic of these devices, achieved due to resonant tunneling, is also ideally suited for the design of highly compact, self-latching logic circuits. As a result, quantum device technology is a promising emerging alternative for high-performance very-large-scale-integration design. The bistable nature of the basic logic gates implemented using resonant tunneling devices has been utilized in the development of a gate-level pipelining technique, called nanopipelining, that significantly improves the throughput and speed of pipelined systems. The advent of multiple-peak resonant tunneling diodes provides a viable means for efficient design of multiple-valued circuits with decreased interconnect complexity and reduced device count as compared to multiple-valued circuits in conventional technologies. This paper details various circuit design accomplishments in the area of binary and multiple-valued logic using resonant tunneling diodes (RTD´s) in conjunction with high-performance III-V devices such as heterojunction bipolar transistors (HBT´s) and modulation doped field-effect transistors (MODFET´s). New bistable logic families using RTD+HBT and RTD+MODFET gates are described that provide a single-gate, self-latching majority function in addition to basic NAND, NOR, and inverter gates
Keywords :
VLSI; integrated circuit interconnections; integrated logic circuits; logic gates; majority logic; multivalued logic circuits; resonant tunnelling diodes; 32 bit; 64 bit; HBT; III-V devices; MODFET; bistable logic families; device count; interconnect complexity; logic gates; majority function; multiple-peak resonant tunneling diodes; multiple-valued circuits; nanopipelining; negative differential resistance characteristic; picosecond device switching speeds; resonant tunneling devices; self-latching logic circuits; semiconductor quantum devices; throughput; tunneling transport mechanism; very-large-scale-integration design; Digital circuits; Logic circuits; Logic devices; Logic gates; MODFET circuits; Pipeline processing; RLC circuits; Resonant tunneling devices; Semiconductor diodes; Very large scale integration;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.663544
Filename :
663544
Link To Document :
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