DocumentCode
1347126
Title
Dimensional analysis of two-layer spherical dielectric resonator
Author
Leung, K.W.
Author_Institution
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon
Volume
10
Issue
4
fYear
2000
fDate
4/1/2000 12:00:00 AM
Firstpage
139
Lastpage
141
Abstract
Dimensional analysis is used to study the complex resonance of a two-layer spherical dielectric resonator (DR). In the analysis, the various dimensionless products, or Pi terms, of the system are found. From the Pi theorem, the Pi terms are related to one another by a function, which is found using the curve-fitting technique in this paper. For demonstration, the fundamental TE mode, the TE111 mode, of a spherical DR is investigated. Simple formulas for the resonant frequency and Q-factor are obtained. The results are compared with the exact solutions and excellent agreement is obtained
Keywords
Q-factor; curve fitting; dielectric resonators; microwave devices; Pi theorem; Q-factor; TE111 mode; complex resonance; curve-fitting technique; dimensional analysis; dimensionless products; fundamental TE mode; resonant frequency; spherical dielectric resonator; two-layer spherical; Curve fitting; Dielectric losses; Helium; Microwave filters; Microwave oscillators; Nonhomogeneous media; Resonance; Resonant frequency; Resonator filters; Tellurium;
fLanguage
English
Journal_Title
Microwave and Guided Wave Letters, IEEE
Publisher
ieee
ISSN
1051-8207
Type
jour
DOI
10.1109/75.846925
Filename
846925
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