Title :
Design for testability of embedded integrated operational amplifiers
Author :
Arabi, Karim ; Kaminska, Bozena
Author_Institution :
Ecole Polytech., Montreal, Que., Canada
fDate :
4/1/1998 12:00:00 AM
Abstract :
The operational amplifier (op amp) is one of the most encountered analog building blocks. In this paper, the problem of testing an integrated op amp is treated. A new low-cost vectorless test solution, known as oscillation test, is investigated to test the op amp. During the test mode, the op amps are converted to a circuit that oscillates and the oscillation frequency is evaluated to monitor faults. The tolerance band of the oscillation frequency is determined using a Monte Carlo analysis taking into account the nominal tolerance of all important technology and design parameters. Faults in the op amps under test which cause the oscillation frequency to exit the tolerance band can therefore be detected. Some Design for Testability (DfT) rules to rearrange op amps to form oscillators are presented and the related practical problems and limitations are discussed. The oscillation frequency can be easily and precisely evaluated using pure digital circuitry. The simulation and practical implementation results confirm that the presented techniques ensure a high fault coverage with a low area overhead
Keywords :
Monte Carlo methods; built-in self test; design for testability; fault diagnosis; integrated circuit testing; operational amplifiers; DfT rules; Monte Carlo analysis; area overhead; embedded integrated operational amplifiers; fault coverage; low-cost vectorless test solution; oscillation frequency; oscillation test; tolerance band; Circuit faults; Circuit testing; Design for testability; Electrical fault detection; Fault detection; Frequency conversion; Monitoring; Monte Carlo methods; Operational amplifiers; Oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of
