DocumentCode
1347476
Title
Economy-class ion-defying ICs in orbit
Author
Benedetto, Ioseph M.
Author_Institution
UTMC Microelectron. Syst., Colorado Springs, CO, USA
Volume
35
Issue
3
fYear
1998
fDate
3/1/1998 12:00:00 AM
Firstpage
36
Lastpage
41
Abstract
Space can be hostile in the extreme to the electronics in the hundreds of satellites now being readied for launch into low orbit. This paper describes how, now more than ever, satellite designers need an economical method of protecting their circuits from permanent damage and transient failure caused by the radiation belts that surround the Earth.
Keywords
artificial satellites; integrated circuits; radiation belts; radiation hardening (electronics); space vehicle electronics; circuit protection; low Earth orbit; permanent damage; radiation belts; satellite electronics; transient failure; Artificial satellites; Belts; Consumer electronics; Costs; Degradation; Earth; Electron traps; Ionizing radiation; Protons; Radiation hardening;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.1998.663756
Filename
663756
Link To Document