• DocumentCode
    1347476
  • Title

    Economy-class ion-defying ICs in orbit

  • Author

    Benedetto, Ioseph M.

  • Author_Institution
    UTMC Microelectron. Syst., Colorado Springs, CO, USA
  • Volume
    35
  • Issue
    3
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    41
  • Abstract
    Space can be hostile in the extreme to the electronics in the hundreds of satellites now being readied for launch into low orbit. This paper describes how, now more than ever, satellite designers need an economical method of protecting their circuits from permanent damage and transient failure caused by the radiation belts that surround the Earth.
  • Keywords
    artificial satellites; integrated circuits; radiation belts; radiation hardening (electronics); space vehicle electronics; circuit protection; low Earth orbit; permanent damage; radiation belts; satellite electronics; transient failure; Artificial satellites; Belts; Consumer electronics; Costs; Degradation; Earth; Electron traps; Ionizing radiation; Protons; Radiation hardening;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1998.663756
  • Filename
    663756