• DocumentCode
    1347501
  • Title

    Distributed TSV Topology for 3-D Power-Supply Networks

  • Author

    Healy, Michael B. ; Lim, Sung Kyu

  • Author_Institution
    TJ Watson Res. Center, IBM Res., Yorktown Heights, NY, USA
  • Volume
    20
  • Issue
    11
  • fYear
    2012
  • Firstpage
    2066
  • Lastpage
    2079
  • Abstract
    3-D integration has the potential to increase performance and decrease energy consumption. However, there are many unsolved issues in the design of these systems. In this work we study the design of 3-D power supply networks and demonstrate a technique specific to 3-D systems that improves IR-drop and dynamic noise over a straightforward extension of traditional design techniques. Previous work in 3-D power delivery network design has simply extended 2-D techniques by treating through-silicon vias (TSVs) as extensions of the C4 bumps. By exploiting the smaller size and much higher interconnect density possible with TSVs we demonstrate significant reduction of nearly 50% in the IR-drop and 42% in the dynamic noise of our large-scale 3-D design. Simulations also show that a 3-tier stack with the distributed TSV topology actually lowers IR-drop by 21% and dynamic noise by 32% over a non-3-D system with less power dissipation. We analyze the power distribution network of an envisioned 1000-core processor with 30 stacked dies and show scaling trends related to both increased stacking and power distribution TSVs. Finally, we examine several techniques for minimizing IR-drop and dynamic noise and their effects on our large-scale 3-D system.
  • Keywords
    energy consumption; integrated circuit interconnections; integrated circuit noise; microprocessor chips; power supply circuits; three-dimensional integrated circuits; 1000-core processor; 3D integration; 3D power delivery network design; 3D power-supply networks; C4 bumps; IR-drop; distributed TSV topology; dynamic noise; energy consumption; large-scale 3D design; power dissipation; power distribution network; through-silicon-via; Layout; Noise; Power system dynamics; Through-silicon vias; Topology; 3-D; inductive noise; power supply network; through-silicon via (TSV);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2167359
  • Filename
    6042350