DocumentCode
1347501
Title
Distributed TSV Topology for 3-D Power-Supply Networks
Author
Healy, Michael B. ; Lim, Sung Kyu
Author_Institution
TJ Watson Res. Center, IBM Res., Yorktown Heights, NY, USA
Volume
20
Issue
11
fYear
2012
Firstpage
2066
Lastpage
2079
Abstract
3-D integration has the potential to increase performance and decrease energy consumption. However, there are many unsolved issues in the design of these systems. In this work we study the design of 3-D power supply networks and demonstrate a technique specific to 3-D systems that improves IR-drop and dynamic noise over a straightforward extension of traditional design techniques. Previous work in 3-D power delivery network design has simply extended 2-D techniques by treating through-silicon vias (TSVs) as extensions of the C4 bumps. By exploiting the smaller size and much higher interconnect density possible with TSVs we demonstrate significant reduction of nearly 50% in the IR-drop and 42% in the dynamic noise of our large-scale 3-D design. Simulations also show that a 3-tier stack with the distributed TSV topology actually lowers IR-drop by 21% and dynamic noise by 32% over a non-3-D system with less power dissipation. We analyze the power distribution network of an envisioned 1000-core processor with 30 stacked dies and show scaling trends related to both increased stacking and power distribution TSVs. Finally, we examine several techniques for minimizing IR-drop and dynamic noise and their effects on our large-scale 3-D system.
Keywords
energy consumption; integrated circuit interconnections; integrated circuit noise; microprocessor chips; power supply circuits; three-dimensional integrated circuits; 1000-core processor; 3D integration; 3D power delivery network design; 3D power-supply networks; C4 bumps; IR-drop; distributed TSV topology; dynamic noise; energy consumption; large-scale 3D design; power dissipation; power distribution network; through-silicon-via; Layout; Noise; Power system dynamics; Through-silicon vias; Topology; 3-D; inductive noise; power supply network; through-silicon via (TSV);
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2167359
Filename
6042350
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