DocumentCode :
1347509
Title :
Boolean Functions Over Nano-Fabrics: Improving Resilience Through Coding
Author :
Lee, Sang Hyun ; Vishwanath, Sriram
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX, USA
Volume :
20
Issue :
11
fYear :
2012
Firstpage :
2054
Lastpage :
2065
Abstract :
This paper determines mechanisms to mitigate errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap, but unreliable nano-device as the main function and reliable, but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don´t-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm. (Here, the word “dynamic programming” is used in the same sense as computer-science literature, i.e., and as an efficient search algorithm over trees).
Keywords :
Boolean functions; CMOS integrated circuits; coding errors; dynamic programming; nanoelectronics; trees (mathematics); Boolean functions; CMOS devices; atomic variations; coding; constraint satisfaction problem; defect rates; error mitigation; nanocircuits; nanodevice; nanofabrics; resilience; tree-based dynamic programming; Boolean functions; Digital arithmetic; Error correction; Integrated circuit reliability; Nanofabrication; Polynomials; Cyclic codes; don´t-care (DC) substitution; error correction; nano-fabrics;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2166417
Filename :
6042351
Link To Document :
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