Title :
Function dependent fully testable programmable logic array
Author :
Mottalib, M.A. ; Prasad, R.V.S.K. ; Dasgupta, P.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
fDate :
3/14/1991 12:00:00 AM
Abstract :
Two techniques for designing function-dependent easily testable programmable logic arrays are presented. The techniques can detect all the multiple stuck-at, crosspoint and bridging faults, as compared with most of the existing techniques where some of the faults, especially bridging faults, remain undetected.
Keywords :
built-in self test; design engineering; integrated circuit testing; logic arrays; logic design; logic testing; PLA design; PLA testing; bridging faults; cross point faults; design for testability; design technique; easily testable; fully testable; function dependent PLA; high fault coverage; multiple faults; multiple stuck at faults; programmable logic array;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910311
