• DocumentCode
    1347848
  • Title

    Electro-thermal-mechanical computations in ZnO arrester elements

  • Author

    Boggs, Steven ; Kuang, Jinbo ; Andoh, Hideyasu ; Nishiwaki, Susumu

  • Author_Institution
    NonLinear Syst. Inc., Ashford, CT, USA
  • Volume
    15
  • Issue
    1
  • fYear
    2000
  • fDate
    1/1/2000 12:00:00 AM
  • Firstpage
    128
  • Lastpage
    134
  • Abstract
    Transient, nonlinear finite element analysis with coupled thermal and electric fields is employed to compute the electric and thermal field distributions in ZnO arrester elements, including both nonlinear electrical and nonlinear thermal properties. Mechanical stress in the element is computed during post processing, based on the thermal field. The data indicate that a metallic protrusion from the sprayed electrode into the ZnO can cause substantial temperature rise in a microscopic region around the defect. The effects of a delamination between the electrode and the ZnO surface are less severe. Statistical computations have been undertaken to explore the effect of nonconducting grains on the disk conduction threshold voltage and disk nonlinearity. The computations yield similar results to those in the literature based on nonlinear circuit equations but are much less time consuming
  • Keywords
    arresters; electric fields; finite element analysis; temperature distribution; thermal analysis; zinc compounds; ZnO; ZnO arrester elements; disk conduction threshold voltage; disk nonlinearity; electric fields; electro-thermal-mechanical computations; field distributions; mechanical stress; metallic protrusion; microscopic region; nonconducting grains; sprayed electrode; temperature rise; thermal fields; transient nonlinear finite element analysis; Arresters; Couplings; Distributed computing; Electrodes; Finite element methods; Spraying; Temperature; Thermal stresses; Transient analysis; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.847240
  • Filename
    847240