DocumentCode :
1348028
Title :
Life of Magnetic Electroless Co-P Thin Films
Author :
Okamoto, Hideo ; Nitta, Haruo ; Ohno, Seigo
Author_Institution :
OKI Engineering Co., Ltd.; 4-10-12, Shibaura, Minatoku, Tokyo 108 JAPAN.
Issue :
5
fYear :
1981
Firstpage :
402
Lastpage :
406
Abstract :
Effective life of electroless Co-P (2.5 wt%) thin films of about 100 nm in thickness was evaluated for both magnetic characteristics and corrosion. The Co-P films were grown on rigid Al substrates overcoated with nonmagnetic Ni-P thick films and were finally covered with electroplated Rh thin films of 120 nm - 180 nm in thickness. The life of the magnetic characteristics was defined as the time to reach 10% deviation from the initial values of Hc (coercive force), Br (remanence), and S (squareness of hysteresis loop). The life of the films for corrosion was defined as the induction period of corrosion. An increase of Hc was observed above 80°C for isothermal annealing, but Br and S were unchanged. The activation energy of the variation of Hc was approximately 0.7 eV below 144°C. The life of magnetic characteristics was estimated to be approximately 4.1 × 104 ¿ 2.3 × 105 hrs at 55°C corresponding to the allowable maximum temperature in field service. The life for corrosion was influenced by the quality of Rh films.
Keywords :
Annealing; Coercive force; Corrosion; Isothermal processes; Life estimation; Magnetic films; Magnetic hysteresis; Remanence; Thick films; Transistors; Corrosion; Estimation of life; Magnetic electroless;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1981.5221147
Filename :
5221147
Link To Document :
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