• DocumentCode
    1348028
  • Title

    Life of Magnetic Electroless Co-P Thin Films

  • Author

    Okamoto, Hideo ; Nitta, Haruo ; Ohno, Seigo

  • Author_Institution
    OKI Engineering Co., Ltd.; 4-10-12, Shibaura, Minatoku, Tokyo 108 JAPAN.
  • Issue
    5
  • fYear
    1981
  • Firstpage
    402
  • Lastpage
    406
  • Abstract
    Effective life of electroless Co-P (2.5 wt%) thin films of about 100 nm in thickness was evaluated for both magnetic characteristics and corrosion. The Co-P films were grown on rigid Al substrates overcoated with nonmagnetic Ni-P thick films and were finally covered with electroplated Rh thin films of 120 nm - 180 nm in thickness. The life of the magnetic characteristics was defined as the time to reach 10% deviation from the initial values of Hc (coercive force), Br (remanence), and S (squareness of hysteresis loop). The life of the films for corrosion was defined as the induction period of corrosion. An increase of Hc was observed above 80°C for isothermal annealing, but Br and S were unchanged. The activation energy of the variation of Hc was approximately 0.7 eV below 144°C. The life of magnetic characteristics was estimated to be approximately 4.1 × 104 ¿ 2.3 × 105 hrs at 55°C corresponding to the allowable maximum temperature in field service. The life for corrosion was influenced by the quality of Rh films.
  • Keywords
    Annealing; Coercive force; Corrosion; Isothermal processes; Life estimation; Magnetic films; Magnetic hysteresis; Remanence; Thick films; Transistors; Corrosion; Estimation of life; Magnetic electroless;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1981.5221147
  • Filename
    5221147