• DocumentCode
    1348153
  • Title

    Prediction Limits for the Last Failure Time of a (Log) Normal Sample from Early Failures

  • Author

    Nelson, Wayne ; Schmee, Josef

  • Author_Institution
    General Electric Co., Schenectady; Bldg. 37, Room 578; G.E. Research & Development; Schenectady, NY 12345 USA.
  • Issue
    5
  • fYear
    1981
  • Firstpage
    461
  • Lastpage
    465
  • Abstract
    Sometimes one wants to predict how long a sample of units will run until all fail. This paper presents prediction limits for the last failure time of a sample from a s-normal or lognormal life distribution when one has observed the earliest r failures.
  • Keywords
    Data analysis; Data engineering; Educational institutions; Exponential distribution; Pareto analysis; Prediction methods; Senior members; Statistical distributions; Statistics; Testing; Censored life data; Lognormal life distributions; Prediction limits; Product life; s-Normal life distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1981.5221171
  • Filename
    5221171
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1348153