Title :
A computation method for evaluating importance-measures of gates in a fault tree
Author :
Lee, Hae Sang ; Lie, Chang Hoon ; Hong, Jung Sik
Author_Institution :
Samsung Data Syst., Seoul, South Korea
fDate :
9/1/1997 12:00:00 AM
Abstract :
This paper extends the Birnbaum importance measure for a basic-event level to a gate-event level. In a fault tree when statistical dependency between gate events exists. An explicit formula is given for gate reliability importance (GR-Imp), and shows how it can compute GR-Imp by using a conventional fault-tree algorithm. The computational algorithm for GR-Imp is given along with numerical results for illustrative examples
Keywords :
fault trees; reliability theory; Birnbaum importance measure; basic-event level; computational algorithm; fault tree; gate importance measures; gate reliability; gate reliability importance; gate-event level; replicated basic event; statistical dependency; Data systems; Fault trees; Reliability; Risk management;
Journal_Title :
Reliability, IEEE Transactions on
