• DocumentCode
    1348231
  • Title

    A computation method for evaluating importance-measures of gates in a fault tree

  • Author

    Lee, Hae Sang ; Lie, Chang Hoon ; Hong, Jung Sik

  • Author_Institution
    Samsung Data Syst., Seoul, South Korea
  • Volume
    46
  • Issue
    3
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    360
  • Lastpage
    365
  • Abstract
    This paper extends the Birnbaum importance measure for a basic-event level to a gate-event level. In a fault tree when statistical dependency between gate events exists. An explicit formula is given for gate reliability importance (GR-Imp), and shows how it can compute GR-Imp by using a conventional fault-tree algorithm. The computational algorithm for GR-Imp is given along with numerical results for illustrative examples
  • Keywords
    fault trees; reliability theory; Birnbaum importance measure; basic-event level; computational algorithm; fault tree; gate importance measures; gate reliability; gate reliability importance; gate-event level; replicated basic event; statistical dependency; Data systems; Fault trees; Reliability; Risk management;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.664007
  • Filename
    664007