• DocumentCode
    1348327
  • Title

    Recent advances in VLSI layout

  • Author

    Kuh, Ernest S. ; Ohtsuki, Tatsuo

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    78
  • Issue
    2
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    263
  • Abstract
    The current status of VLSI layout and directions for future research are addressed, with emphasis on the authors´ own work. Necessary terminology and definitions and, whenever possible, a precise formulation of the problems are provided. Placement and floorplanning for both the sea-of-gates and building-block designs are examined. The former emphasizes the connectivity specification, whereas the latter must also consider module shape and size. Global routing based on a method of successive cuts on a chip is discussed. This is a hierarchical top-down approach that is useful for both of the above designs. A two-dimensional detailed routing problem and the rip-up and rerouting problem are also discussed. The field of computational geometry and its application to layout-in particular, to gridless routing and compaction-are reviewed, and layout engines are considered
  • Keywords
    VLSI; circuit layout CAD; logic arrays; VLSI layout; advances in VLSI layout; building-block designs; circuit layout CAD; compaction; computational geometry; connectivity specification; definitions; floorplanning; future research; global routing; gridless routing; hierarchical top-down approach; layout engines; method of successive cuts; module shape; placement; rip-up and rerouting problem; sea-of-gates; size; status; terminology; two-dimensional detailed routing problem; Application software; Application specific integrated circuits; Computational geometry; Design automation; Engines; Grid computing; Physics computing; Routing; Simulated annealing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.52212
  • Filename
    52212