• DocumentCode
    1348380
  • Title

    Sb-heterostructure interband backward diodes

  • Author

    Schulman, J.N. ; Chow, D.H.

  • Author_Institution
    LLC, HRL Lab., Malibu, CA, USA
  • Volume
    21
  • Issue
    7
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    353
  • Lastpage
    355
  • Abstract
    Backward diodes are a version of Esaki tunnel diodes that are useful for mixing and detection. Ge backward diodes in particular have been used as temperature insensitive, zero bias square law detectors, capable of translating low level RF power into DC voltage or current with extreme linearity and low noise. However, Ge diodes are difficult to reproducibly manufacture and are physically fragile. Here we demonstrate specially designed Sb-heterostructure-based backward diodes grown by molecular beam epitaxy. These diodes have superior figures of merit compared to Ge diodes, especially the current density and junction resistance, and are reproducible and physically rugged. In addition, the flexibility of MBE growth allows easy tailoring of the layer structure to maximize the desired figure of merit for a given application.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; millimetre wave detectors; millimetre wave diodes; molecular beam epitaxial growth; p-n heterojunctions; tunnel diodes; EHF; Esaki tunnel diodes; InAl-AlSb-GaSb; MBE growth; MM-wave diodes; Sb-heterostructure-based diodes; backward diodes; current density; figures of merit; junction resistance; molecular beam epitaxy; physically rugged device; Current density; Detectors; Diodes; Linearity; Manufacturing; Molecular beam epitaxial growth; Noise level; Radio frequency; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.847378
  • Filename
    847378