DocumentCode
1348380
Title
Sb-heterostructure interband backward diodes
Author
Schulman, J.N. ; Chow, D.H.
Author_Institution
LLC, HRL Lab., Malibu, CA, USA
Volume
21
Issue
7
fYear
2000
fDate
7/1/2000 12:00:00 AM
Firstpage
353
Lastpage
355
Abstract
Backward diodes are a version of Esaki tunnel diodes that are useful for mixing and detection. Ge backward diodes in particular have been used as temperature insensitive, zero bias square law detectors, capable of translating low level RF power into DC voltage or current with extreme linearity and low noise. However, Ge diodes are difficult to reproducibly manufacture and are physically fragile. Here we demonstrate specially designed Sb-heterostructure-based backward diodes grown by molecular beam epitaxy. These diodes have superior figures of merit compared to Ge diodes, especially the current density and junction resistance, and are reproducible and physically rugged. In addition, the flexibility of MBE growth allows easy tailoring of the layer structure to maximize the desired figure of merit for a given application.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; millimetre wave detectors; millimetre wave diodes; molecular beam epitaxial growth; p-n heterojunctions; tunnel diodes; EHF; Esaki tunnel diodes; InAl-AlSb-GaSb; MBE growth; MM-wave diodes; Sb-heterostructure-based diodes; backward diodes; current density; figures of merit; junction resistance; molecular beam epitaxy; physically rugged device; Current density; Detectors; Diodes; Linearity; Manufacturing; Molecular beam epitaxial growth; Noise level; Radio frequency; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.847378
Filename
847378
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