DocumentCode :
1348380
Title :
Sb-heterostructure interband backward diodes
Author :
Schulman, J.N. ; Chow, D.H.
Author_Institution :
LLC, HRL Lab., Malibu, CA, USA
Volume :
21
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
353
Lastpage :
355
Abstract :
Backward diodes are a version of Esaki tunnel diodes that are useful for mixing and detection. Ge backward diodes in particular have been used as temperature insensitive, zero bias square law detectors, capable of translating low level RF power into DC voltage or current with extreme linearity and low noise. However, Ge diodes are difficult to reproducibly manufacture and are physically fragile. Here we demonstrate specially designed Sb-heterostructure-based backward diodes grown by molecular beam epitaxy. These diodes have superior figures of merit compared to Ge diodes, especially the current density and junction resistance, and are reproducible and physically rugged. In addition, the flexibility of MBE growth allows easy tailoring of the layer structure to maximize the desired figure of merit for a given application.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; millimetre wave detectors; millimetre wave diodes; molecular beam epitaxial growth; p-n heterojunctions; tunnel diodes; EHF; Esaki tunnel diodes; InAl-AlSb-GaSb; MBE growth; MM-wave diodes; Sb-heterostructure-based diodes; backward diodes; current density; figures of merit; junction resistance; molecular beam epitaxy; physically rugged device; Current density; Detectors; Diodes; Linearity; Manufacturing; Molecular beam epitaxial growth; Noise level; Radio frequency; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.847378
Filename :
847378
Link To Document :
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