• DocumentCode
    1348404
  • Title

    Graphene for CMOS and Beyond CMOS Applications

  • Author

    Banerjee, Sanjay K. ; Register, Leonard Franklin ; Tutuc, Emanuel ; Basu, Dipanjan ; Kim, Seyoung ; Reddy, Dharmendar ; MacDonald, Allan H.

  • Author_Institution
    Microelectron. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
  • Volume
    98
  • Issue
    12
  • fYear
    2010
  • Firstpage
    2032
  • Lastpage
    2046
  • Abstract
    Owing in part to complementary metal-oxide-semiconductor (CMOS) scaling issues, the semiconductor industry is placing an increased emphasis on emerging materials and devices that may provide a solution beyond the 22-nm node. Single and few layers of carbon sheets (graphene) have been fabricated by a variety of techniques including mechanical exfoliation and chemical vapor deposition, and field-effect devices have been demonstrated with room temperature field-effect mobilities close to 10 000 cm2/Vs. But since graphene is a gapless semiconductor, these transistors have high off-state leakage and nonsaturating drive currents. This is problematic for digital logic, but is acceptable for analog device applications such as low-noise amplifiers and radio-frequency (RF)/millimeter-wave field-effect transistors (FETs). The remarkable transport physics of graphene due to its linear bandstructure have led to novel beyond CMOS logic devices as well, such as “pseudospin” devices.
  • Keywords
    CMOS logic circuits; chemical vapour deposition; field effect transistors; graphene; C; CMOS logic devices; beyond CMOS; chemical vapor deposition; complementary metal-oxide-semiconductor; digital logic; field-effect devices; gapless semiconductor; graphene; mechanical exfoliation; semiconductor industry; size 22 nm; temperature 293 K to 298 K; transistors; CMOS integrated circuits; Dielectrics; FETs; Graphene; Logic gates; Nanoelectronics; Physics; Beyond complementary metal–oxide–semiconductor (CMOS) logic; graphene field-effect transistors (FETs); nanoelectronics;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2010.2064151
  • Filename
    5599843