DocumentCode
1348404
Title
Graphene for CMOS and Beyond CMOS Applications
Author
Banerjee, Sanjay K. ; Register, Leonard Franklin ; Tutuc, Emanuel ; Basu, Dipanjan ; Kim, Seyoung ; Reddy, Dharmendar ; MacDonald, Allan H.
Author_Institution
Microelectron. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
Volume
98
Issue
12
fYear
2010
Firstpage
2032
Lastpage
2046
Abstract
Owing in part to complementary metal-oxide-semiconductor (CMOS) scaling issues, the semiconductor industry is placing an increased emphasis on emerging materials and devices that may provide a solution beyond the 22-nm node. Single and few layers of carbon sheets (graphene) have been fabricated by a variety of techniques including mechanical exfoliation and chemical vapor deposition, and field-effect devices have been demonstrated with room temperature field-effect mobilities close to 10 000 cm2/Vs. But since graphene is a gapless semiconductor, these transistors have high off-state leakage and nonsaturating drive currents. This is problematic for digital logic, but is acceptable for analog device applications such as low-noise amplifiers and radio-frequency (RF)/millimeter-wave field-effect transistors (FETs). The remarkable transport physics of graphene due to its linear bandstructure have led to novel beyond CMOS logic devices as well, such as “pseudospin” devices.
Keywords
CMOS logic circuits; chemical vapour deposition; field effect transistors; graphene; C; CMOS logic devices; beyond CMOS; chemical vapor deposition; complementary metal-oxide-semiconductor; digital logic; field-effect devices; gapless semiconductor; graphene; mechanical exfoliation; semiconductor industry; size 22 nm; temperature 293 K to 298 K; transistors; CMOS integrated circuits; Dielectrics; FETs; Graphene; Logic gates; Nanoelectronics; Physics; Beyond complementary metal–oxide–semiconductor (CMOS) logic; graphene field-effect transistors (FETs); nanoelectronics;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2010.2064151
Filename
5599843
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