DocumentCode :
1348404
Title :
Graphene for CMOS and Beyond CMOS Applications
Author :
Banerjee, Sanjay K. ; Register, Leonard Franklin ; Tutuc, Emanuel ; Basu, Dipanjan ; Kim, Seyoung ; Reddy, Dharmendar ; MacDonald, Allan H.
Author_Institution :
Microelectron. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
Volume :
98
Issue :
12
fYear :
2010
Firstpage :
2032
Lastpage :
2046
Abstract :
Owing in part to complementary metal-oxide-semiconductor (CMOS) scaling issues, the semiconductor industry is placing an increased emphasis on emerging materials and devices that may provide a solution beyond the 22-nm node. Single and few layers of carbon sheets (graphene) have been fabricated by a variety of techniques including mechanical exfoliation and chemical vapor deposition, and field-effect devices have been demonstrated with room temperature field-effect mobilities close to 10 000 cm2/Vs. But since graphene is a gapless semiconductor, these transistors have high off-state leakage and nonsaturating drive currents. This is problematic for digital logic, but is acceptable for analog device applications such as low-noise amplifiers and radio-frequency (RF)/millimeter-wave field-effect transistors (FETs). The remarkable transport physics of graphene due to its linear bandstructure have led to novel beyond CMOS logic devices as well, such as “pseudospin” devices.
Keywords :
CMOS logic circuits; chemical vapour deposition; field effect transistors; graphene; C; CMOS logic devices; beyond CMOS; chemical vapor deposition; complementary metal-oxide-semiconductor; digital logic; field-effect devices; gapless semiconductor; graphene; mechanical exfoliation; semiconductor industry; size 22 nm; temperature 293 K to 298 K; transistors; CMOS integrated circuits; Dielectrics; FETs; Graphene; Logic gates; Nanoelectronics; Physics; Beyond complementary metal–oxide–semiconductor (CMOS) logic; graphene field-effect transistors (FETs); nanoelectronics;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2010.2064151
Filename :
5599843
Link To Document :
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