Title :
Active Curve Recovery of Region Boundary Patterns
Author :
Ben Salah, Mohamed ; Ben Ayed, Ismail ; Mitiche, Amar
Author_Institution :
Dept. of Comput. Sci., Univ. of Alberta, Edmonton, AB, Canada
fDate :
5/1/2012 12:00:00 AM
Abstract :
This study investigates the recovery of region boundary patterns in an image by a variational level set method which drives an active curve to coincide with boundaries on which a feature distribution matches a reference distribution. We formulate the scheme for both the Kullback-Leibler and the Bhattacharyya similarities, and apply it in two conditions: the simultaneous recovery of all region boundaries consistent with a given outline pattern, and segmentation in the presence of faded boundary segments. The first task uses an image-based geometric feature, and the second a photometric feature. In each case, the corresponding curve evolution equation can be viewed as a geodesic active contour (GAC) flow having a variable stopping function which depends on the feature distribution on the active curve. This affords a potent global representation of the target boundaries, which can effectively drive active curve segmentation in a variety of otherwise adverse conditions. Detailed experimentation shows that the scheme can significantly improve on current region and edge-based formulations.
Keywords :
differential geometry; edge detection; feature extraction; image representation; image segmentation; variational techniques; Bhattacharyya similarity; GAC flow; Kullback-Leibler similarity; active curve recovery; active curve segmentation; curve evolution equation; faded boundary segment; feature distribution; geodesic active contour flow; image based geometric feature; photometric feature; region boundary pattern recovery; variable stopping function; variational level set method; Equations; Image edge detection; Image segmentation; Level set; Magnetic resonance imaging; Mathematical model; Shape; Image segmentation; active curves; boundary feature distributions; boundary patterns; level sets; similarity measures.;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.201