Title :
Instrumentation III: The microprocessor takeover: On-the-spot mathematics, automatic testing, and portable calibration are yielding to microprocessor solutions
Author :
Falk, Heiko ; Kaplan, G.
fDate :
4/1/1976 12:00:00 AM
Abstract :
Samples the information on microprocessor applications including on-the-spot mathematics, automatic testing, and portable calibration.
Keywords :
automatic test equipment; calibration; mathematics; microcomputers; production testing; PMOS; PROM; RAM; applications; automatic testing; mathematics; microprocessor; portable calibration; production testing; Instruments; Microcomputers; Microprocessors; Monitoring; Process control; Testing; Transducers;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1976.6367451
