DocumentCode :
1348474
Title :
Instrumentation V: ICs: From sensors to displays: Instrument performance is up, costs are down. It´s done, not with mirrors, but with integrated circuits
Author :
Allan, R.
Volume :
13
Issue :
4
fYear :
1976
fDate :
4/1/1976 12:00:00 AM
Firstpage :
58
Lastpage :
62
Abstract :
From small simple digital panel meters to large sophisticated test systems, integrated circuits continue to have a vast impact on improvements in instrument performance. The driving force behind all this has been the continuous increase in IC-device volumetric efficiency-from SSI to MSI to today´s LSI ICs.
Keywords :
display equipment; electric sensing devices; instrumentation; large scale integration; monolithic integrated circuits; LSI; digital panel meters; displays; microprocessor; monolithic IC; sensors; test systems; thick film technology; thin film technology; Instruments; Integrated circuit modeling; Large scale integration; Microprocessors; Sensors; Transducers;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1976.6367453
Filename :
6367453
Link To Document :
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