DocumentCode :
1348481
Title :
Instrumentation VI: What´s new in test gear: The shopping list of versatile, compact, and cost-efficient instruments is an engineer´s delight
Author :
Allan, R.
Volume :
13
Issue :
4
fYear :
1976
fDate :
4/1/1976 12:00:00 AM
Firstpage :
63
Lastpage :
66
Abstract :
Two trends can be seen in test and measurement instruments. The first is the movement toward instrument clusters-mini instrument systems-and away from the individual instrument of the past. These instrument systems are either hooked up together with external interface cables, or are tied together on card cages in a single package. The other trend is the development of low-cost dedicated instruments to do well only specific tasks at minimum cost.
Keywords :
measurement systems; test equipment; measurement instrument; microprocessor; mini instrument systems; test gear; trends; Companies; Frequency measurement; Microprocessors; Noise; Oscilloscopes; Radiation detectors;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1976.6367454
Filename :
6367454
Link To Document :
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