• DocumentCode
    1348481
  • Title

    Instrumentation VI: What´s new in test gear: The shopping list of versatile, compact, and cost-efficient instruments is an engineer´s delight

  • Author

    Allan, R.

  • Volume
    13
  • Issue
    4
  • fYear
    1976
  • fDate
    4/1/1976 12:00:00 AM
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    Two trends can be seen in test and measurement instruments. The first is the movement toward instrument clusters-mini instrument systems-and away from the individual instrument of the past. These instrument systems are either hooked up together with external interface cables, or are tied together on card cages in a single package. The other trend is the development of low-cost dedicated instruments to do well only specific tasks at minimum cost.
  • Keywords
    measurement systems; test equipment; measurement instrument; microprocessor; mini instrument systems; test gear; trends; Companies; Frequency measurement; Microprocessors; Noise; Oscilloscopes; Radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1976.6367454
  • Filename
    6367454