Title :
An Arnoldi Algorithm for Power-Delivery Networks With Variable Dielectric Constant and Loss Tangent
Author_Institution :
Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
Abstract :
The tracking-sensitivity algorithm is an efficient method to calculate the changes in the network matrix of a circuit, when a global parameter, such as temperature, is continuously varied. In this paper, we apply the concept of tracking sensitivity on the frequency-domain simulation of power-delivery networks (PDNs) in chip packages and printed circuit boards. The global variable we consider is the complex permittivity of the dielectric. We present a methodology to calculate the change in the PDN impedance due to a variation in the dielectric constant, loss tangent, or both. This information is useful not only to understand any deviations between simulations and measurements, but also to understand the impact of the variability of these dielectric properties on the performance of the PDN. Using the tracking-sensitivity algorithm, we can efficiently recalculate the impedance matrix after changing a global parameter. The classical tracking-sensitivity algorithm was based on a power series expansion. This paper presents a more accurate approach based on the block Arnoldi algorithm.
Keywords :
chip scale packaging; impedance matrix; permittivity; power electronics; printed circuits; block Arnoldi algorithm; chip packages; dielectric permittivity; frequency-domain simulation; impedance matrix; loss tangent; network matrix; power series expansion; power-delivery network; printed circuit boards; tracking-sensitivity algorithm; variable dielectric constant; Algorithm design and analysis; Dielectric constant; Dielectric losses; Impedance; Printed circuits; Sensitivity; Voltage fluctuations; Block Arnoldi; decoupling; ground bounce; power-delivery network (PDN); power-integrity optimization; simultaneous switching noise; target impedance; tracking sensitivity;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2010.2075933