Title :
Normalized analysis for the sensitivity optimization of integrated optical evanescent-wave sensors
Author :
Parriaux, Olivier ; Veldhuis, G.J.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fDate :
4/1/1998 12:00:00 AM
Abstract :
Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface
Keywords :
biosensors; chemical sensors; optical planar waveguides; optical sensors; optical waveguide theory; optimisation; refractive index; sensitivity; TE mode evanescent-wave step-index waveguide sensors; TM mode evanescent-wave step-index waveguide sensors; closed-form analytical expressions; integrated optical evanescent-wave sensors; maximum sensitivity; normalized analysis; normalized charts; semi-infinite waveguide cover; sensitivity optimization; ultrathin film; waveguide-cover interface; Biosensors; Integrated optics; Magnetic field measurement; Magnetic sensors; Optical films; Optical refraction; Optical sensors; Optical surface waves; Optical waveguides; Surface waves;
Journal_Title :
Lightwave Technology, Journal of
