DocumentCode :
134868
Title :
A comparative study of VSC-OPF techniques for voltage security improvement and losses reduction
Author :
Zabaiou, Tarik ; Dessaint, Louis-A. ; Kamwa, Innocent
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Super. (ETS), Montréal, QC, Canada
fYear :
2014
fDate :
27-31 July 2014
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents and compares three voltage stability constrained optimal power flow (VSC-OPF) techniques for both voltage stability improvement and power losses minimization. The techniques are based on static voltage stability indices which provide important information about the proximity of the system to voltage collapse. The first one is a new concept based on the line voltage collapse proximity indicator (VCPI), the second utilizes the bus voltage stability indicator L-index and the last one focuses on the minimum singular value (MSV) of the power flow Jacobian matrix. The approaches are described in detail and evaluated on the IEEE 14-bus and 30-bus test systems, where their performances are compared under different operating conditions.
Keywords :
Jacobian matrices; load flow control; minimisation; power system dynamic stability; power system security; IEEE 14-bus test systems; IEEE 30-bus test systems; MSV; VCPI; VSC-OPF techniques; bus voltage stability indicator L-index; line voltage collapse proximity indicator; losses reduction; minimum singular value; power flow Jacobian matrix; power losses minimization; static voltage stability indices; voltage security improvement; voltage stability constrained optimal power flow techniques; Indexes; Load flow; Numerical stability; Power system stability; Reactive power; Stability criteria; Preventive control; Static voltage stability indices; VSC-OPF; Voltage stability improvement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
PES General Meeting | Conference & Exposition, 2014 IEEE
Conference_Location :
National Harbor, MD
Type :
conf
DOI :
10.1109/PESGM.2014.6939000
Filename :
6939000
Link To Document :
بازگشت