DocumentCode
1348711
Title
Patterns in Listings of Failure-Rate & MTTF Values and Listings of Other Data
Author
Becker, Peter W.
Author_Institution
Electronics Laboratory; Technical University of Denmark; DK-2800 Lyngby, DENMARK.
Issue
2
fYear
1982
fDate
6/1/1982 12:00:00 AM
Firstpage
132
Lastpage
134
Abstract
It has been observed that the decimal parts of failure-rate and MTTF values as listed in tables tend to have a logarithmic distribution. A possible explanation for this phenomenon is given. When such tables have been generated they should be examined to see if the anticipated distribution is present; should that not be the case, a systematic error might well be present. Such testing is one practical application of the observation. The decimal-values from long lists of data quite often tend to have a logarithmic distribution as pointed out by Newcomb and Benford. The phenomenon may be explained in several different ways, depending upon the nature of the data. References to their papers and those by other authors are given. The reader may turn to tables in his own field of interest; such tables will in all likelihood also show the same regularity.
Keywords
Arithmetic; Failure analysis; Frequency; Information geometry; Pattern analysis; Probability density function; Reflection; Resistors; Testing; Wire; Failure rate values; Logarithmic distribution; MTTF values;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1982.5221273
Filename
5221273
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