• DocumentCode
    1348711
  • Title

    Patterns in Listings of Failure-Rate & MTTF Values and Listings of Other Data

  • Author

    Becker, Peter W.

  • Author_Institution
    Electronics Laboratory; Technical University of Denmark; DK-2800 Lyngby, DENMARK.
  • Issue
    2
  • fYear
    1982
  • fDate
    6/1/1982 12:00:00 AM
  • Firstpage
    132
  • Lastpage
    134
  • Abstract
    It has been observed that the decimal parts of failure-rate and MTTF values as listed in tables tend to have a logarithmic distribution. A possible explanation for this phenomenon is given. When such tables have been generated they should be examined to see if the anticipated distribution is present; should that not be the case, a systematic error might well be present. Such testing is one practical application of the observation. The decimal-values from long lists of data quite often tend to have a logarithmic distribution as pointed out by Newcomb and Benford. The phenomenon may be explained in several different ways, depending upon the nature of the data. References to their papers and those by other authors are given. The reader may turn to tables in his own field of interest; such tables will in all likelihood also show the same regularity.
  • Keywords
    Arithmetic; Failure analysis; Frequency; Information geometry; Pattern analysis; Probability density function; Reflection; Resistors; Testing; Wire; Failure rate values; Logarithmic distribution; MTTF values;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1982.5221273
  • Filename
    5221273