• DocumentCode
    1348739
  • Title

    Clock Distribution Networks in 3-D Integrated Systems

  • Author

    Pavlidis, Vasilis F. ; Savidis, Ioannis ; Friedman, Eby G.

  • Author_Institution
    Integrated Syst. Lab., EPFL, Lausanne, Switzerland
  • Volume
    19
  • Issue
    12
  • fYear
    2011
  • Firstpage
    2256
  • Lastpage
    2266
  • Abstract
    3-D integration is an important technology that addresses fundamental limitations in on-chip interconnects. Several design issues related to 3-D circuits, such as multiplane synchronization, however, need to be addressed. A comparison of three 3-D clock distribution network topologies is presented in this paper. Good agreement is shown between the modeled and experimental results of a 3-D test circuit composed of three device planes. Successful operation of the 3-D test circuit at 1.4 GHz is demonstrated. Clock skew, clock delay, signal slew, and power dissipation measurements for the different clock topologies are also provided. The measurements suggest that each topology provides certain advantages and disadvantages in terms of different performance criteria. The proper choice, consequently, of a clock distribution network is not dictated by a single design objective but rather by the overall 3-D system design requirements including availability of resources and number of bonded planes.
  • Keywords
    clocks; three-dimensional integrated circuits; 3D circuits; 3D clock distribution network topologies; 3D integrated systems; 3D integration; 3D test circuit; bonded planes; clock delay; clock skew; device planes; frequency 1.4 GHz; multiplane synchronization; on-chip interconnects; power dissipation measurements; signal slew; Clocks; Delay; Driver circuits; Integrated circuit interconnections; Network topology; Synchronization; Topology; 3-D clock characterization; 3-D clock distribution; 3-D clock modeling; 3-D synchronization;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2073724
  • Filename
    5599895