• DocumentCode
    1348965
  • Title

    What went wrong I: The failure tracers: A review off how reliability experts and analysts probe for the primary cause off device and systems faults

  • Author

    Allan, R.

  • Volume
    13
  • Issue
    10
  • fYear
    1976
  • Firstpage
    33
  • Lastpage
    40
  • Abstract
    A review is given of how reliability experts and analysts probe for the primary cause of device and systems faults.
  • Keywords
    fault location; reliability; analysts; device faults; failure tracers; reliability experts; systems faults; Failure analysis; Integrated circuits; Metallization; Random access memory; Reliability; Wires;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1976.6367546
  • Filename
    6367546
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1348965