Title :
Photovoltaic Array Reliability Optimization
Author :
Ross, Ronald G., Jr.
Author_Institution :
Mail Stop 510-200, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109 USA.
Abstract :
Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these studies and draws general conclusions relative to optimal reliability features for modules. The analysis is based on designing for specified low levels of component failures and then controlling the degrading effects of the failures through the use of fault tolerant circuitry and module replacement. Means of selecting the cost-optimal level of component failures, circuit redundancy, and module replacement are described.
Keywords :
Degradation; Dielectrics and electrical insulation; Electric breakdown; Failure analysis; Fatigue; Glass; Integrated circuit interconnections; Integrated circuit reliability; Photovoltaic systems; Solar power generation; Circuit design; Fault tolerance; Photovoltaics; Solar cell;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1982.5221328