• DocumentCode
    1349047
  • Title

    Systematic evaluation and analysis for 60-GHz dielectric resonators coupled to a microstrip line on a GaAs substrate

  • Author

    Hosoya, Ken´ichi ; Inoue, Takashi ; Funabashi, Masahiro ; Ohata, Keiichi

  • Author_Institution
    Kansai Electron. Res. Lab., NEC Corp., Shiga, Japan
  • Volume
    46
  • Issue
    4
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    352
  • Lastpage
    358
  • Abstract
    This paper presents the first systematic evaluation and analysis of 60-GHz-band TE01δ-mode cylindrical dielectric resonators coupled to a microstrip line on a GaAs substrate. The loss components of the unloaded Q are analyzed using simple numerical techniques. The distance between the resonator center and the microstrip line which gives the maximum coupling coefficient is found to be approximately 3/5 of the resonator radius, whose ratio is almost constant for all practical cases. The temperature characteristics are also demonstrated and the origins of temperature dependences of the unloaded Q and the coupling coefficient are discussed. An equivalent circuit model for the dielectric resonator coupled to the microstrip line is presented, whose element parameters can express the dependences of the resonant frequency, the unloaded Q, and the coupling coefficient on the structural parameters and the temperature
  • Keywords
    III-V semiconductors; Q-factor; dielectric resonators; equivalent circuits; gallium arsenide; microstrip lines; 60 GHz; GaAs; GaAs substrate; TE-mode cylindrical dielectric resonator; coupling coefficient; equivalent circuit model; loss; microstrip line; resonant frequency; temperature dependence; unloaded Q factor; Coupling circuits; Dielectric substrates; Equivalent circuits; Gallium arsenide; Microstrip resonators; Millimeter wave integrated circuits; Millimeter wave technology; Millimeter wave transistors; Resonant frequency; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.664136
  • Filename
    664136