DocumentCode :
1349351
Title :
Efficient capacitance extraction computations in wavelet domain
Author :
Soveiko, Nick ; Nakhla, Michel S.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Volume :
47
Issue :
5
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
684
Lastpage :
701
Abstract :
A new approach is presented for efficient capacitance extraction. This technique utilizes wavelet bases and is kernel independent. The main benefits of the proposed technique are as follows: (1) it takes a full advantage of the multiresolution analysis and gives accurate total charge on a conductor without obtaining an accurate solution for the charge density per se; (2) the method employs an extremely aggressive thresholding algorithm and compresses the stiffness matrix to an almost diagonal sparse matrix; and (3) construction of the stiffness matrix is performed iteratively, which facilitates easy and simple control of convergence and provides means of trading accuracy for speed. The proposed method has computational cost of O(N), versus O(N3) for conventional methods. The proposed algorithm has a major impact on the speed and accuracy of physical interconnect parameter extraction with speedup reaching 103 for even moderately sized problems
Keywords :
capacitance; convergence of numerical methods; high-speed integrated circuits; integral equations; integrated circuit interconnections; matrix algebra; method of moments; wavelet transforms; BEM; capacitance extraction computations; conductor total charge; convergence control; diagonal sparse matrix; interconnect parameter extraction; multiresolution analysis; stiffness matrix compression; thresholding algorithm; wavelet bases; wavelet domain; Capacitance; Computational efficiency; Finite difference methods; Integral equations; Integrated circuit interconnections; Iterative algorithms; Kernel; Parameter extraction; Sparse matrices; Wavelet domain;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.847874
Filename :
847874
Link To Document :
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