• DocumentCode
    1349522
  • Title

    Nonparametric Accelerated Life Testing

  • Author

    Basu, A.P. ; Ebrahimi, Nader

  • Author_Institution
    Department of Statistics; University of Missouri; Columbia, Missouri 65211 USA.
  • Issue
    5
  • fYear
    1982
  • Firstpage
    432
  • Lastpage
    435
  • Abstract
    This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution at use-stress is given for both cases.
  • Keywords
    Acceleration; Costs; Life estimation; Life testing; Lifetime estimation; Neural networks; Reliability theory; Statistical analysis; Stress; System testing; Accelerated life tests; Censored data; Competing risks; Nonparametric methods; Series system; s-Consistent estimator;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1982.5221417
  • Filename
    5221417
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1349522