DocumentCode
1349632
Title
An error indicator and automatic adaptive meshing for electrostatic boundary element simulations
Author
Bächtold, Martin ; Emmenegger, Markus ; Korvink, Jan G. ; Baltes, Henry
Author_Institution
Phys. Electron. Lab., Zurich, Switzerland
Volume
16
Issue
12
fYear
1997
fDate
12/1/1997 12:00:00 AM
Firstpage
1439
Lastpage
1446
Abstract
Accurate electrostatic simulations are required for the analysis of micro electromechanical systems (MEMS) and interconnects in very large scale integration (VLSI) design. Typical simulations involve complex three-dimensional (3-D) geometries together with various dielectric materials, conductors, and boundary conditions. The boundary element method is well suited for such computations. For highly accurate solutions, the meshing of the geometry becomes increasingly important. A scheme is presented which allows generating an optimal mesh automatically based on a coarse initial discretization, e.g., a CAD model. An error indicator derived from boundary integral equations monitors the solution accuracy in each boundary element. H-type or p-type mesh refinement is applied to areas which contribute strongly to the overall error. The method applies to both two-dimensional (2-D) and 3-D simulations containing elements of various orders and shapes. The generated refined meshes result in significantly higher solution accuracy for a given simulation size
Keywords
VLSI; boundary integral equations; boundary-elements methods; digital simulation; electrostatics; integrated circuit interconnections; micromechanical devices; 2D simulations; 3D geometries; CAD model; VLSI; automatic adaptive meshing; coarse initial discretization; electrostatic boundary element simulations; error indicator; integral equations; interconnects; micro electromechanical systems; optimal mesh; simulation size; solution accuracy; Analytical models; Computational modeling; Conducting materials; Dielectric materials; Electromechanical systems; Electrostatic analysis; Geometry; Micromechanical devices; Solid modeling; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.664226
Filename
664226
Link To Document