DocumentCode :
1349639
Title :
Transient analysis of diode switching circuits using asymptotic waveform evaluation
Author :
Beyene, Wendemagegnehu T. ; Schutt-Ainé, José E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
16
Issue :
12
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
1447
Lastpage :
1453
Abstract :
An efficient transient analysis of diode switching circuits using the asymptotic waveform evaluation (AWE) technique is presented. The method accurately simulates the excess carrier redistribution phenomenon in a diode junction using a reduced order model. The diode model is derived by directly solving the carrier continuity equations in an analogous manner to that of the AWE solution to transmission-line equations. The method efficiently calculates the poles and the residues of the diode model by recursively generating the moments of the carrier concentrations. It reduces the computational cost by an order of magnitude over that for Linvill´s multisection model of ladder or lattice networks of many lumped elements used to model carrier diffusion and the recombination process. The pole-residue model is capable of providing an increasingly accurate approximation to the characteristics of a diode under all operating conditions. The diode recovery phenomenon is simulated for illustration, and the improved accuracy is verified by comparisons with results from conventional methods and published works
Keywords :
circuit analysis computing; digital simulation; power electronics; switching circuits; transient analysis; asymptotic waveform evaluation; carrier continuity equations; computational cost; diode recovery phenomenon; diode switching circuits; excess carrier redistribution phenomenon; poles; reduced order model; residues; transient analysis; Analytical models; Circuit simulation; Diffusion processes; Diodes; Equations; Predictive models; Reduced order systems; SPICE; Switching circuits; Transient analysis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.664227
Filename :
664227
Link To Document :
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