Synthesis of asynchronous circuits for stuck-at and robust path delay fault testability

In this paper, we present methods for synthesizing multilevel asynchronous circuits to be both hazard free and completely testable. Making an asynchronous two-level circuit hazard free usually requires the introduction of either redundant or nonprime cubes or both. This adversely affects the circuit´s testability. However, using extra inputs, which is seldom necessary, and a synthesis-for-testability method, we convert the two-level circuit into a multilevel circuit that is completely testable. To avoid the addition of extra inputs as much as possible, we introduce new exact minimization algorithms for hazard-free two-level logic where we first minimize the number of redundant cubes and then minimize the number of nonprime cubes. We target both the stuck-at and robust path delay fault models using similar methods. However, the area overhead for the latter may be slightly higher than for the former