DocumentCode
1349755
Title
On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance
Author
Bogorad, Alexander L. ; Likar, Justin J. ; Lombardi, Robert E. ; Stone, Stephen E. ; Herschitz, Roman
Author_Institution
Lockheed Martin Space Syst., Newtown, PA, USA
Volume
58
Issue
6
fYear
2011
Firstpage
2804
Lastpage
2806
Abstract
SEU data for more than 250 equivalent on-orbit SRAM device years is compared with upset rate calculations using various environmental models and contributions of both direct ionization and nuclear interactions.
Keywords
SRAM chips; error statistics; ionisation; radiation hardening (electronics); RHBD SRAM; SEU data; calculation techniques; direct ionization; nuclear interactions; on-orbit SRAM device; on-orbit error rates; space environmental models; upset rate calculations; CMOS integrated circuits; Protons; Radiation effects; SRAM chips; Single event upset; Space vehicles; Radiation effects; single event upset (SEU); space radiation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2167242
Filename
6044740
Link To Document