• DocumentCode
    1349809
  • Title

    Supply voltage scaling for temperature insensitive CMOS circuit operation

  • Author

    Bellaouar, A. ; Fridi, A. ; Elmasry, M.I. ; Itoh, K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    415
  • Lastpage
    417
  • Abstract
    CMOS supply voltage scaling for temperature independent gate delay is investigated. It is found that the optimum supply voltage which results in temperature insensitive operation is proportional to the threshold voltage. This voltage enables a single battery cell operation. CMOS technologies with 0.35- and 0.25-μm size features are used as examples in this study
  • Keywords
    CMOS digital integrated circuits; VLSI; delays; integrated circuit design; 0.25 micron; 0.35 micron; digital circuits; feature size; gate delay; single battery cell operation; supply voltage scaling; temperature insensitive CMOS circuit; threshold voltage; Batteries; CMOS technology; Circuit simulation; Delay effects; Dynamic voltage scaling; Equations; Power dissipation; Power supplies; Temperature; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.664253
  • Filename
    664253
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1349809