• DocumentCode
    1349985
  • Title

    Properties of inductively coupled plasma source with helical coil

  • Author

    Park, Jong-Chul ; Lee, Jae Koo ; Kang, Bongkoo

  • Author_Institution
    Samsung Electron. Co., Kyungki, South Korea
  • Volume
    28
  • Issue
    2
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    403
  • Lastpage
    413
  • Abstract
    This paper presents modeling and experimental results of the voltage, current, and density profiles of a helical resonator plasma source. The source has a 5/4-wavelength (λ) helical resonator structure with the helical coil short-circuited at one end and open circuited at the other end. When the radio frequency (RF) tap for power feeding was located at an odd multiple of λ/4 from the short-circuited end, the observed voltage, current, and plasma density were higher in the short-circuited section than those in the open-circuited section. The opposite property was observed with the RF tap at an even multiple of λ/4. A microstrip transmission line model was used to explain the experimental results. The model accurately predicted the RF voltage and current profiles. After calculation of RF voltage and current, the plasma density was solved numerically. The difference between the calculated and measured plasma density was within a factor of two. The changes on the density profile indicate that the transport properties of plasma can be adjusted with the RF tap position
  • Keywords
    plasma density; plasma diagnostics; plasma production; plasma transport processes; short-circuit currents; 0 to 1200 V; 0 to 50 cm; 5/4-wavelength helical resonator structure; RF tap position; RF voltage profile; current profile; density profile; helical coil; helical coil short-circuit; helical resonator plasma source; inductively coupled plasma source; microstrip transmission line model; open circuit; plasma density; plasma transport properties; power feeding; radio frequency tap; short-circuited section; slab model; voltage profile; Coils; Coupling circuits; Microstrip; Plasma density; Plasma measurements; Plasma properties; Plasma sources; Power transmission lines; Radio frequency; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.848099
  • Filename
    848099