DocumentCode
1350000
Title
Modeling the Dependent Competing Risks With Multiple Degradation Processes and Random Shock Using Time-Varying Copulas
Author
Wang, Yaping ; Pham, Hoang
Author_Institution
Dept. of Ind. & Syst. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume
61
Issue
1
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
13
Lastpage
22
Abstract
We develop s-dependent competing risk model for systems subject to multiple degradation processes and random shocks using time-varying copulas. The proposed model allows for a more flexible dependence structure between risks in which (a) the dependent relationship between random shocks and degradation processes is modulated by a time-scaled covariate factor, and (b) the dependent relationship among various degradation processes is fitted using the copula method. Two types of random shocks are considered in the model: fatal shocks, which fails the system immediately; and nonfatal shocks, which does not. In a nonfatal shock situation there are two impacts towards the degradation processes: sudden increment jumps, and degradation rate accelerations. The comparison results of the system reliability estimation from both constant and time-varying copulas are illustrated in the numerical examples to demonstrate the application of the proposed model. The modified joint distribution bounds in terms of Kendall´s tau and Spearman´s rho provide an improvement to Frechet-Hoeffding bounds for estimating the possible system reliability range.
Keywords
covariance analysis; random processes; reliability theory; Frechet-Hoeffding bounds; copula method; degradation rate acceleration; dependence structure; distribution bounds; fatal shock; multiple degradation process; random shocks; s-dependent competing risk model; system reliability estimation; time-scaled covariate factor; time-varying copulas; Acceleration; Degradation; Electric shock; Joints; Mathematical model; Random variables; Reliability; Copula method; dependent competing risks; fatal shocks; multiple degradation;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2011.2170253
Filename
6045314
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