• DocumentCode
    1350000
  • Title

    Modeling the Dependent Competing Risks With Multiple Degradation Processes and Random Shock Using Time-Varying Copulas

  • Author

    Wang, Yaping ; Pham, Hoang

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    61
  • Issue
    1
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    22
  • Abstract
    We develop s-dependent competing risk model for systems subject to multiple degradation processes and random shocks using time-varying copulas. The proposed model allows for a more flexible dependence structure between risks in which (a) the dependent relationship between random shocks and degradation processes is modulated by a time-scaled covariate factor, and (b) the dependent relationship among various degradation processes is fitted using the copula method. Two types of random shocks are considered in the model: fatal shocks, which fails the system immediately; and nonfatal shocks, which does not. In a nonfatal shock situation there are two impacts towards the degradation processes: sudden increment jumps, and degradation rate accelerations. The comparison results of the system reliability estimation from both constant and time-varying copulas are illustrated in the numerical examples to demonstrate the application of the proposed model. The modified joint distribution bounds in terms of Kendall´s tau and Spearman´s rho provide an improvement to Frechet-Hoeffding bounds for estimating the possible system reliability range.
  • Keywords
    covariance analysis; random processes; reliability theory; Frechet-Hoeffding bounds; copula method; degradation rate acceleration; dependence structure; distribution bounds; fatal shock; multiple degradation process; random shocks; s-dependent competing risk model; system reliability estimation; time-scaled covariate factor; time-varying copulas; Acceleration; Degradation; Electric shock; Joints; Mathematical model; Random variables; Reliability; Copula method; dependent competing risks; fatal shocks; multiple degradation;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2011.2170253
  • Filename
    6045314