Texture induced noise and its impact on system performance

Author

Lin, G.H. ; Xing, X. ; Johnson, K.E. ; Bertram, H.N.

Author_Institution

Stoarge Syst. Div., IBM Corp., San Jose, CA, USA

Volume

33

Issue

1

fYear

1997

fDate

1/1/1997 12:00:00 AM

Firstpage

950

Lastpage

955

Abstract

In this work, the effect of substrate texture on thin film disk noise and its impact on system performance are systematically examined. The surface structures of thin film disks with different substrate textures are characterized using Atomic Force Microscopy (AFM). Recording spectral analysis and AFM measurement yield disk surface parameters, surface roughness, correlation lengths of the texturing process both parallel and perpendicular to the texture line direction, and cross-hatch angle, all of which are used to characterize the texture noise. An error rate model that includes correlated texture noise is developed. Results are presented for various recorded patterns on disks with different textures. Error rate measurements are also performed. In general, it is shown that an improved system error rate results from a shorter perpendicular correlation length, smaller cross-hatch angle, and a smoother disk surface. The impact of texture on high density recording is also examined and discussed in detail

Keywords

atomic force microscopy; magnetic disc storage; magnetic recording noise; surface texture; atomic force microscopy; correlation length; cross-hatch angle; error rate model; high density recording; spectral analysis; substrate texture; surface roughness; surface structure; thin film disk noise; Atomic force microscopy; Disk recording; Error analysis; Rough surfaces; Substrates; Surface roughness; Surface structures; Surface texture; System performance; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.560137

Filename

560137