• DocumentCode
    1350071
  • Title

    Narrow track recording characteristics in thin film media

  • Author

    Zhu, Jian-Gang ; Lam, Terence ; Fang, Hao ; Chang, Thomas ; Tong, Hua-Ching ; Rottmayer, R.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    33
  • Issue
    1
  • fYear
    1997
  • fDate
    1/1/1997 12:00:00 AM
  • Firstpage
    984
  • Lastpage
    989
  • Abstract
    In this paper, we report a combined spin-stand measurement and micromagnetic simulation study on narrow track recording characteristics in thin film media. It is found that the onset recording density of nonlinear partial erasure is determined by intertransition percolations near the track edges where the head field gradient is poor. Trimming into the shared pole in merged MR/thin film heads is necessary for performance at both high linear and high track densities. Increasing head field magnitude with respect to medium coercivity increases the width of erase band but not the actual transition track width. When the head is skewed, the edge field overwrites on-track transitions, resulting in a reduction of effective transition track width. The trimming of the shared pole in merged MR/thin film heads can significantly reduce this edge overwrite effect. It is suggested that servo writing schemes should be modified to take into account the phenomena described in this paper
  • Keywords
    digital magnetic recording; hard discs; magnetic heads; edge overwrite effect reduction; head field magnitude; head skew; high track densities; intertransition percolations; medium coercivity; merged MR/thin film heads; micromagnetic simulation; narrow track recording characteristics; nonlinear partial erasure; onset recording density; pole trimming; servo writing schemes; spin-stand measurement; thin film media; transition track width; Density measurement; Frequency domain analysis; Frequency measurement; Information technology; Magnetic heads; Measurement techniques; Micromagnetics; Transistors; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.560143
  • Filename
    560143