• DocumentCode
    1350081
  • Title

    Interval Reliability for Initiating and Enabling Events

  • Author

    Dunglinson, Colin ; Lambert, Howard

  • Author_Institution
    E.I. duPont de Nemours & Co.; PO Box 2626; Victoria, TX 77902 USA.
  • Issue
    2
  • fYear
    1983
  • fDate
    6/1/1983 12:00:00 AM
  • Firstpage
    150
  • Lastpage
    163
  • Abstract
    This paper describes generation and evaluation of logic models such as fault trees for interval reliability. Interval reliability assesses the ability of a system to operate over a specific time interval without failure. The analysis requires that the sequence of events leading to system failure be identified. Two types of events are described: 1) initiating events (cause disturbances or perturbations in system variables) that cause system failure and 2) enabling events (permit initiating events to cause system failure). Control-system failures are treated. The engineering and mathematical concepts are described in terms of a simplified example of a pressure-tank system. Later these same concepts are used in an actual industrial application in which an existing chlorine vaporizer system was modified to improve safety without compromising system availability. Computer codes that are capable of performing the calculations, and pitfalls in computing accident frequency in fault tree analysis, are discussed.
  • Keywords
    Application software; Availability; Electrical equipment industry; Failure analysis; Fault trees; Frequency; Industrial accidents; Logic; Performance analysis; Safety; Accident prevention; Common-cause initiating event; Control-system reliability analysis; Design tradeoff; Digraph analysis; Event tree-fault tree approach; Fault-tree analysis; Fault-tree computer code; Interval reliability; Probabilistic importance; Probabilistic risk assessment; Quantitative safety analysis; Time ordering of events; Top-event occurrence frequency;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1983.5221514
  • Filename
    5221514