DocumentCode
1350106
Title
Vertically integrated sensors for advanced imaging applications
Author
Benthien, Stephan ; Lulé, Tarek ; Schneider, Bernd ; Wagner, Michael ; Verhoeven, Markus ; Böhm, Markus
Author_Institution
Silicon Vision GmbH, Siegen, Germany
Volume
35
Issue
7
fYear
2000
fDate
7/1/2000 12:00:00 AM
Firstpage
939
Lastpage
945
Abstract
A thin film on ASIC (TFA) image sensor is fabricated depositing an amorphous silicon thin-film detector onto a CMOS ASIC. With regards to advanced imaging systems, TFA provides enhanced performance and more flexibility than conventional technologies. Extensive on-chip signal processing is feasible, as well as small pixels for high resolution imagers. Two new TFA imager prototypes have recently been fabricated. High-resolution image sensor (HIRISE II) with 1024/spl times/128 pixels is an active pixel sensor suited for digital photography. Local autoadaptiver sensor (LARS II) with 368/spl times/256 pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include correlated double sampling and double delta sampling for efficient suppression of fixed pattern noise.
Keywords
CMOS image sensors; amorphous semiconductors; application specific integrated circuits; elemental semiconductors; image sampling; readout electronics; semiconductor thin films; silicon; 1024 pixel; 128 pixel; 131072 pixel; 256 pixel; 368 pixel; 93440 pixel; CMOS ASIC; HIRISE II; LARS II; Si; active pixel sensor; advanced imaging applications; amorphous Si thin-film detector; automotive applications; correlated double sampling; digital photography; double delta sampling; fixed pattern noise suppression; high resolution imagers; local autoadaptiver sensor; onchip signal processing; thin film on ASIC image sensor; vertically integrated sensors; Amorphous silicon; Application specific integrated circuits; Detectors; Image sensors; Pixel; Prototypes; Sampling methods; Semiconductor thin films; Sputtering; Thin film sensors;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.848201
Filename
848201
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