• DocumentCode
    1350106
  • Title

    Vertically integrated sensors for advanced imaging applications

  • Author

    Benthien, Stephan ; Lulé, Tarek ; Schneider, Bernd ; Wagner, Michael ; Verhoeven, Markus ; Böhm, Markus

  • Author_Institution
    Silicon Vision GmbH, Siegen, Germany
  • Volume
    35
  • Issue
    7
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    939
  • Lastpage
    945
  • Abstract
    A thin film on ASIC (TFA) image sensor is fabricated depositing an amorphous silicon thin-film detector onto a CMOS ASIC. With regards to advanced imaging systems, TFA provides enhanced performance and more flexibility than conventional technologies. Extensive on-chip signal processing is feasible, as well as small pixels for high resolution imagers. Two new TFA imager prototypes have recently been fabricated. High-resolution image sensor (HIRISE II) with 1024/spl times/128 pixels is an active pixel sensor suited for digital photography. Local autoadaptiver sensor (LARS II) with 368/spl times/256 pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include correlated double sampling and double delta sampling for efficient suppression of fixed pattern noise.
  • Keywords
    CMOS image sensors; amorphous semiconductors; application specific integrated circuits; elemental semiconductors; image sampling; readout electronics; semiconductor thin films; silicon; 1024 pixel; 128 pixel; 131072 pixel; 256 pixel; 368 pixel; 93440 pixel; CMOS ASIC; HIRISE II; LARS II; Si; active pixel sensor; advanced imaging applications; amorphous Si thin-film detector; automotive applications; correlated double sampling; digital photography; double delta sampling; fixed pattern noise suppression; high resolution imagers; local autoadaptiver sensor; onchip signal processing; thin film on ASIC image sensor; vertically integrated sensors; Amorphous silicon; Application specific integrated circuits; Detectors; Image sensors; Pixel; Prototypes; Sampling methods; Semiconductor thin films; Sputtering; Thin film sensors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.848201
  • Filename
    848201