DocumentCode :
1350106
Title :
Vertically integrated sensors for advanced imaging applications
Author :
Benthien, Stephan ; Lulé, Tarek ; Schneider, Bernd ; Wagner, Michael ; Verhoeven, Markus ; Böhm, Markus
Author_Institution :
Silicon Vision GmbH, Siegen, Germany
Volume :
35
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
939
Lastpage :
945
Abstract :
A thin film on ASIC (TFA) image sensor is fabricated depositing an amorphous silicon thin-film detector onto a CMOS ASIC. With regards to advanced imaging systems, TFA provides enhanced performance and more flexibility than conventional technologies. Extensive on-chip signal processing is feasible, as well as small pixels for high resolution imagers. Two new TFA imager prototypes have recently been fabricated. High-resolution image sensor (HIRISE II) with 1024/spl times/128 pixels is an active pixel sensor suited for digital photography. Local autoadaptiver sensor (LARS II) with 368/spl times/256 pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include correlated double sampling and double delta sampling for efficient suppression of fixed pattern noise.
Keywords :
CMOS image sensors; amorphous semiconductors; application specific integrated circuits; elemental semiconductors; image sampling; readout electronics; semiconductor thin films; silicon; 1024 pixel; 128 pixel; 131072 pixel; 256 pixel; 368 pixel; 93440 pixel; CMOS ASIC; HIRISE II; LARS II; Si; active pixel sensor; advanced imaging applications; amorphous Si thin-film detector; automotive applications; correlated double sampling; digital photography; double delta sampling; fixed pattern noise suppression; high resolution imagers; local autoadaptiver sensor; onchip signal processing; thin film on ASIC image sensor; vertically integrated sensors; Amorphous silicon; Application specific integrated circuits; Detectors; Image sensors; Pixel; Prototypes; Sampling methods; Semiconductor thin films; Sputtering; Thin film sensors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.848201
Filename :
848201
Link To Document :
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