DocumentCode :
1350188
Title :
A 2-GHz low-phase-noise integrated LC-VCO set with flicker-noise upconversion minimization
Author :
De Muer, Bram ; Borremans, M. ; Steyaert, M. ; Puma, G. Li
Author_Institution :
Katholieke Univ., Leuven, Heverlee, Belgium
Volume :
35
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
1034
Lastpage :
1038
Abstract :
A fully integrated 2-GHz very low-phase-noise LC-tank voltage-controlled oscillator (VCO) set with flicker noise upconversion minimization is presented. Using only integrated planar inductors, the measured phase noise is as low as -125.1 dBc/Hz at 600-kHz offset and -138 dBc/Hz at 3 MHz. The excellent phase-noise performance is achieved by means of an in-house-developed integrated inductor simulator optimizer. To minimize the upconversion of flicker noise to 1/f/sup 3/ phase noise, a flicker-noise upconversion factor is defined, which can easily be extracted from circuit simulation. The technique is applied to demonstrate the relationship between the flicker-noise upconversion and the overdrive level of the oscillators´ MOS cross-coupled pair and to develop circuit balancing techniques to even further reduce the flicker-noise upconversion. The 1/f/sup 3/ phase-noise corner is minimized to be less than 15 kHz. The VCO´s are implemented in a three-metal layer, 0.65-/spl mu/m BiCMOS process, using only MOS active devices.
Keywords :
BiCMOS analogue integrated circuits; MMIC oscillators; UHF integrated circuits; UHF oscillators; flicker noise; inductors; integrated circuit noise; phase noise; voltage-controlled oscillators; 0.65 micron; 2 GHz; BiCMOS process; LC-tank voltage-controlled oscillator; MOS cross-coupled pair; circuit balancing techniques; flicker-noise upconversion minimization; integrated LC-VCO set; integrated inductor simulator optimizer; integrated planar inductors; overdrive level; phase noise; three-metal layer process; 1f noise; BiCMOS integrated circuits; Circuit simulation; Inductors; Minimization; Noise measurement; Phase measurement; Phase noise; Voltage fluctuations; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.848213
Filename :
848213
Link To Document :
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