Title :
Fast performance analysis of NAND flash-based storage device
Author :
Won, S.K. ; Ha, Su Hwa ; Chung, E.Y.
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
A fast performance analysis method for NAND flash-based storage devices (NFSDs) is proposed. The method first profiles the operational statistics of an NFSD and then estimates its throughput based on the proposed model. Experimental results show that its accuracy reaches up to 98.7% of the cycle-accurate simulation, while the analysis speedup is more than three orders of magnitude. Also, the generality of the method is shown by applying it to NFSDs with an arbitrary number of channels.
Keywords :
NAND circuits; flash memories; NAND flash-based storage device; cycle-accurate simulation; fast performance analysis method; operational statistics;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2009.2166