Title :
Analysis and Methods for Detection of Some DC Amplifier Errors
Author_Institution :
Appl. Phys. Lab., The Johns Hopkins Univ., Silver Spring, Md.
fDate :
3/1/1960 12:00:00 AM
Keywords :
Choppers; Computational modeling; Computer simulation; Diodes; Integrated circuit yield; Power supplies; Relays; Switches; Switching circuits; Voltage;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1960.5221609
